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Mr. Zhou was invited to participate in the 18th Annual Conference and Exhibition of the Non-destructive Testing Branch of the Chinese Mechanical Engineering Society

Mr. Zhou was invited to participate in the 18th Annual Conference and Exhibition of the Non-destructive Testing Branch of the Chinese Mechanical Engineering Society

(Summary description)Mr. Zhou was invited to participate in the 18th Annual Conference and Exhibition of the Non-destructive Testing Branch of the Chinese Mechanical Engineering Society

Mr. Zhou was invited to participate in the 18th Annual Conference and Exhibition of the Non-destructive Testing Branch of the Chinese Mechanical Engineering Society

(Summary description)Mr. Zhou was invited to participate in the 18th Annual Conference and Exhibition of the Non-destructive Testing Branch of the Chinese Mechanical Engineering Society

Information

The 10th Annual Conference of Non-destructive Testing Branch of Chinese Mechanical Engineering Society was held in Nanchang Hangkong University. This annual meeting is sponsored by the National Society for Nondestructive Testing and undertaken by the Key Laboratory of Nondestructive Testing Technology of the Ministry of Education of Nanchang Hangkong University. Changchao Electronics Research Institute is a silver sponsor.

The theme of the 10th National Non-destructive Testing Academic Annual Conference and Instrument and Equipment Exhibition: "Give full play to independent innovation of science and technology, and lead the development of the economy by leaps and bounds". The purpose of the conference is to comprehensively summarize the research results of China's non-destructive testing technology in recent years, strengthen exchanges and cooperation between related industries, promote the promotion and application of new theories, new methods, and new technologies in non-destructive testing, and promote the development of China's non-destructive testing industry.

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